|
|
 Ecopia HMS-3000 Hall Measurement System  |
|
The Ecopia HMS-3000 Hall Measurement System is a complete system for measuring the resistivity, carrier concentration, and mobility of semiconductors. The HMS-3000 includes software with I-V curve capability. The systems can be used to characterize various materials including silicon, compound semiconductors, metal layers, oxides, etc., at room temperature and 77K (liquid nitrogen temperature). Comparison of HMS-3000 with the former HMS-2000 (18K Excel file). Characteristics Simplicity and Accuracy Simple Operation - Speedy Data Results   (click the photo below to see a larger image)  kit (not the 1.0T) and it has spring loaded clips and spring loaded tips to make contact without using bonding wires. (When using the Spring Clip Board, usually the contacts must still be annealed with a conductive material such as indium to insure good probe contact) (click the photo below to see a larger image)  method for sample mounting using the Spring Clip Board Product Composition Features Specifications: General Data input of depth enables comprehensive measurement of the whole material. Current source: Voltage measurements:  
 Click photo to see a larger image  Click photo to see a larger image  Click photo to see a larger image Downloadable documents and information regarding the Hall Measurement System: 1) A two page flyer regarding the HMS-3000 a 170K PDF file 2) A guide to installing and using the HMS-3000 Hall Effect Measurement System [2.4 MEG PDF file] 3) Operating Manual for the HMS-3000 System [2.9 MEG PDF file] 4) A document regarding the sample mounting boards for use with the HMS-3000 system [116K PDF file] 5) Download a PDF file [734K] describing the process for bonding a sample to one of the test boards used in the HMS-3000 Hall Effect Measurement System 6) A well done Wikipedia article regarding the Van der Pauw method: http://en.wikipedia.org/wiki/Van_der_Pauw_method. 7) An NIST web page, http://www.eeel.nist.gov/812/hall.html, regarding the theory and implementation of the Hall Effect Measurement technique 8) Download a PDF file [434K] which shows the MP55T sample holder/magnet set that has TWO 0.55T magnets on a slide mechanism which relieves the user from having to remove the magnet and replace it on the other side of the sample kit. Using the MP55T sample kit, the user only needs to position the side in one of the three positions, i.e., the "no magnet" position, the "north magnet" position, or the "south magnet" position. The slide moves very easily. The MP55T is available on a new system instead of the usual magnet kit, or it can be purchased as an upgrade to an existing system. 9) White Papers that mention the use of the HMS-3000: The following papers are copyrighted materials that you can find on the web by searching for the name using google. Include the quotation marks in your google search. Once you have purchased the PDF document, you can search in the documment for "HMS" to find the reference: "Preparation and Properties of Multiwalled Carbon Nanotube/Polycaprolactone Nanocomposites" "Structure, optical, and electrical properties of indium tin oxide thin films prepared by sputtering at room temperature and annealed..." "Sintering behaviors and electrical properties of transparent conducting..." To request further information please call Bridge Technology at (480) 988-2256 or send e-mail to Larry Bridge at: sales@bridgetec.com |
| Four-Point-Probes is a division of Bridge Technology. To request further information please call Bridge Technology at (480) 988-2256 or send e-mail to Larry Bridge at: sales@bridgetec.com |
| HOME |
